Impact of FinFET with plural number of channel width using novel one step of trench formation process on fabrication cost for system LSIYu Hiroshima,Shigeyoshi WatanabeContemporary engineering sciences（2018）引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
