Analysis of Hot Carrier Degradation for LDMOS under Gate Pulse StressK. Furuya,T. Nitta,T. Katayama,K. Hatasako,T. Kuroi, Shigeto MaegawaThe Japan Society of Applied Physics(2009)引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要