Low-degree test with polynomially small error

Computational Complexity(2016)

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摘要
long line of work in Theoretical Computer Science shows that a function is close to a low-degree polynomial iff it is locally close to a low-degree polynomial. This is known as low-degree testing and is the core of the algebraic approach to construction of PCP. We obtain a low-degree test whose error, i.e., the probability it accepts a function that does not correspond to a low-degree polynomial, is polynomially smaller than existing low-degree tests. A key tool in our analysis is an analysis of the sampling properties of the incidence graph of degree- k curves and k ′-tuples of points in a finite space 𝔽^m . We show that the Sliding Scale Conjecture in PCP, namely the conjecture that there are PCP verifiers whose error is exponentially small in their randomness, would follow from a derandomization of our low-degree test.
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关键词
Low-degree testing, PCP, direct product, Sliding Scale Conjecture, 68Q17, 68Q25
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