Measurement of two-pot S-parameters of an amplifier using one-port vector network analyzer
2016 ASIA-PACIFIC MICROWAVE CONFERENCE (APMC2016)(2016)
摘要
This paper describes a measurement technique to reconstruct the two-port scattering parameters of an amplifier from five one-port results measured by a vector network analyzer (VNA). Formulation on the use of auxiliary circuits and one-port VNA is given. The criterion in selecting the auxiliary circuit is also addressed. The reconstructed results are shown in close agreement with the directly measured results.
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关键词
two-pot S-parameter measurement,one-port vector network analyzer,two-port scattering parameters,one-port VNA,auxiliary circuits,amplifier scattering parameters
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