谷歌浏览器插件
订阅小程序
在清言上使用

Characterization of Fast, Accurate Leakage Power Models for IEEE P2416

Barkha Gupta,W. Rhett Davis

20th International Symposium on Quality Electronic Design (ISQED)(2019)

引用 2|浏览10
暂无评分
摘要
Recent results in power modeling for the emerging IEEE Standard Association project P2416 are presented. The standard promises to bring accurate power-modeling capability to system-level digital design tools. This paper presents the leakage power-model characterization approach in detail in the context of a simple four-gate circuit. Simulation results with a commercial 45nm technology over a range of temperatures and supply voltages show agreement with SPICE to within 1.8% on average and 16.6% in the worst case with a speedup of over 15,000X.
更多
查看译文
关键词
accurate leakage power models,ieee
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要