A New Method of Accurately Measuring Photoconductive Performance of 4H-SiC Photoconductive Switches

IEEE Electron Device Letters(2019)

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摘要
A new method of accurately measuring the photoconductive performance of photoconductive semiconductor switch (PCSS) was proposed. By this method, we succeeded extracting the photoconductivity of 4H-SiC substrate free from the obstruction of parasitic inductance in the test circuit. Photoconductive performance of the PCSS was precisely measured, where a maximum ON-state photoconductivity of 6.26 (Ω...
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关键词
Resistance,Optical switches,Density measurement,Power system measurements,Silicon carbide,Electrical resistance measurement,Photoconductivity
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