Monte Carlo Simulation of Displacement Damage in Graphene

This paper introduces a Monte Carlo (MC) approach based on the binary collision approximation to estimate defect types and densities in proton- and heavy-ion-irradiated graphene layers. The types and concentrations of defects that appear in graphene due to irradiation with various ions with energies ranging from ~100 keV to ~100 MeV are identified. This simple method enables defect introduction ra...