Practical Fault Localization with Combinatorial Test Design

2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)(2019)

引用 6|浏览65
暂无评分
摘要
Combinatorial test design is a well-known effective technique for test planning. However, in order to fully realize its potential in industrial settings, it needs to be considered as an integral part of the end to end testing flow rather than as an isolated component. In this work, we present an automated end to end solution for CTD-based test optimization, generation, execution and fault localization, implemented in an industrial framework. We further report on our initial promising experience in applying it to an industrial product.
更多
查看译文
关键词
Computer bugs,Color,Cats,Dogs,Shape,Automation
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要