A Multiple Fault Localization Approach Based on Multicriteria Analytical Hierarchy Process
2019 IEEE International Conference On Artificial Intelligence Testing (AITest)(2019)
摘要
Fault localization problem is one of the most difficult processes in software debugging. Several spectrum-based ranking metrics have been proposed and none is shown to be empirically optimal. In this paper, we consider the fault localization problem as a multicriteria decision making problem. The proposed approach tackles the different metrics by aggregating them into a single metric using a weighted linear formulation. A learning step is used to maintain the right expected weights of criteria. This approach is based on Analytic Hierarchy Process (AHP), where a ranking is given to a statement in terms of suspiciousness according to a comparison of ranks given by the different metrics. Experiments performed on standard benchmark programs show that our approach enables to propose a more precise localization than existing spectrum-based metrics.
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关键词
Fault Localization,Spectrum-based Fault Localization,Multiple Fault,Multicriteria Decision Making,AHP
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