A Comprehensive Methodology to Evaluate Losses and Process Variations in Silicon Solar Cell Manufacturing

Mohammad Jobayer Hossain
Mohammad Jobayer Hossain
Geoffrey Gregory
Geoffrey Gregory
Eric John Schneller
Eric John Schneller
Andrew M. Gabor
Andrew M. Gabor
Zhihao Yang
Zhihao Yang
Dana Sulas
Dana Sulas
Kristopher Olan Davis
Kristopher Olan Davis

IEEE Journal of Photovoltaics, pp. 1350-1359, 2019.

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Abstract:

Novel, high-throughput metrology methods are used in this paper for detailed performance loss analysis of approximately 400 industrial crystalline silicon solar cells, all coming from the same production line. The characterization sequence combines traditional global cell measurements (e.g., current–voltage, Suns- <inline-formula xmlns:mm...More

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