Effects of boron doping on solid phase crystallization of in situ doped amorphous Silicon thin films prepared by electron beam evaporation

Thin Solid Films(2020)

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摘要
•Homogeneous in situ boron doping by controlling the effusion cell temperature.•Stepwise increase in active boron atoms leads to increase in crystallization of non-hydrogenated a-Si.•No significant change in boron binding energies during the crystallization process.
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关键词
Non-hydrogenated amorphous silicon,Polysilicon,In-situ boron doping,Thin films,Solid-phase crystallization,Electron beam evaporation,Effusion cell,Raman spectroscopy,Time-of-flight secondary ion mass spectroscopy,X-ray photoelectron spectroscopy
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