NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

Alvson D. Topper,Edward J. Wyrwas,Kaitlyn Ryder,Kenneth A. LaBel,Jonathan A. Pellish, Peter J. Majewicz,Donna J. Cochran,Martha V. O'Bryan,Megan C. Casey,Jean-Marie Lauenstein, Scott D. Stansberry,Michae J. Campola,Edward P. Wilcox,Ray L. Ladbury,Melanie D. Berg

2019 IEEE Radiation Effects Data Workshop（2019）

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摘要

Total ionizing dose, displacement damage dose, and single-event effect testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, bipolar devices, and FPGAs.

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