Performance Enhancement of 3-D NAND Flash Featuring a Two-Step Dummy Wordline Program Waveform and Pair-Bitline Program Scheme
IEEE Transactions on Electron Devices, pp. 99-104, 2020.
In this work, we report two performance enhancement schemes for single-gate vertical-channel (SGVC) 3-D NAND Flash. The first one features a programming (PGM) waveform where the bias of the dummy wordline (DWL) is raised in a two-step manner so that the resultant disturbance that the DWL and edge WL suffer is appreciably alleviated. The s...More
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