Deep-Learning-Based Small Surface Defect Detection via an Exaggerated Local Variation-Based Generative Adversarial Network

Rong Luo
Rong Luo
Deepak Kumar Jain
Deepak Kumar Jain
Neeraj Kumar
Neeraj Kumar

IEEE Transactions on Industrial Informatics, pp. 1343-1351, 2020.

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Abstract:

Surface detection of small defects plays a vital role in manufacturing and has attracted broad interest. It remains challenging primarily due to the small size of the defect relative to the large surface and the rare occurrence of defects. To address this problem, in this article we propose a novel machine vision approach for automaticall...More

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