EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification.

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2020)

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摘要
Electronics supply chain vulnerabilities have broadened in scope over the past two decades. With nearly all integrated circuit (IC) design companies relinquishing their fabrication, packaging, and test facilities, they are forced to rely upon companies from around the world to produce their ICs. This dependence leaves the electronics supply chain open to counterfeiting activities. In this article,...
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关键词
Integrated circuits,Inspection,Clocks,Supply chains,Machine learning,Packaging,Antenna measurements
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