Identifying Failure-Causing Schemas in the Presence of Multiple Faults

Xintao Niu (钮鑫涛)

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Changhai Nie (聂长海)

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Jeff Y. Lei

Hareton K. N. Leung

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Xiaoyin Wang

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IEEE Transactions on Software Engineering, pp. 141-162, 2020.

Cited by: 5|Views33

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Keywords:

TestingBarsFault diagnosisComputer bugsSoftware algorithmsMore(1+)

Abstract:

Combinatorial testing (CT) has been proven effective in revealing the failures caused by the interaction of factors that affect the behavior of a system. The theory of Minimal Failure-Causing Schema (MFS) has been proposed to isolate the cause of a failure after CT. Most algorithms that aim to identify MFS focus on handling a single fault...More

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