Multi-failure Admittance Sequence for Flow Transfer Problem of Electromagnetic Loop Network
2019 22nd International Conference on Electrical Machines and Systems (ICEMS)(2019)
摘要
The core problem of an electromagnetic loop network (EMLN) is the flow transfer problem. It is dominated by the characteristic of the electrical distance between the two endpoints of EMLN when one or more HV failures, i.e. the failures at the high voltage lines, occur. In order to quantify the above mechanism, this paper defines the multi-failure admittance sequence, and transform the high voltage side network of EMLN equivalently into a set of parallel identical multi-lines accordingly. The crucial factors of the normalized multi-failure admittance sequence are extracted to assess succinctly the ability of EMLN to endure the HV multi-failure from perspective of electrical distances. They elaborate that a stronger ability of EMLN to endure the HV multi-failure obtains 1) a smaller normalized multi-failure admittance sequence value at t
1
, 2) a larger normalized multi-failure admittance sequence value before t
1
, 3) a slower speed that normalized multi-failure admittance sequence decreases before t
1
, as well as 4) a later t
1
, where t
1
is the moment that the critical branch is removed in the normalized multi-failure admittance sequence. An actual EMLN in northeast China is tested to substantiate the proposed method.
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关键词
power network,electromagnetic loop network,flow transfer problem,electrical distance
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