Parallelizable Bayesian optimization for analog and mixed-signal rare failure detection with high coverage

ICCAD '18: IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN San Diego California November, 2018, pp. 1-8, 2018.

Cited by: 1|Bibtex|Views9
EI
Other Links: dl.acm.org

Abstract:

Due to inherent complex behaviors and stringent requirements in analog and mixed-signal (AMS) systems, verification becomes a key bottleneck in the product development cycle. For the first time, we present a Bayesian optimization (BO) based approach to the challenging problem of verifying AMS circuits with stringent low failure requiremen...More

Code:

Data:

Your rating :
0

 

Tags
Comments