Parallelizable Bayesian optimization for analog and mixed-signal rare failure detection with high coverage
ICCAD '18: IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN San Diego California November, 2018, pp. 1-8, 2018.
Due to inherent complex behaviors and stringent requirements in analog and mixed-signal (AMS) systems, verification becomes a key bottleneck in the product development cycle. For the first time, we present a Bayesian optimization (BO) based approach to the challenging problem of verifying AMS circuits with stringent low failure requiremen...More
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