Analysis using Photon-in Photon-out Spectroscopy

Introduction Recent interest in nanotechnology and Organic Light Emitting Devices (OLED) has prompted intense research in the electronic structure and optical properties of relevant materials. Here we report recent development and applications of X-ray excited optical luminescence (XEOL) [1-5]. XEOL, using tunable synchrotron light as an excitation source, monitors the optical response following inner shell excitation of an element in a light emitting material in both the energy and time domain. XEOL from several prototype materials will be presented to illustrate its application in material analysis.