Raman Thermography of Peak Channel Temperature in $\beta$ -Ga 2 O 3 MOSFETs
IEEE Electron Device Letters(2019)
摘要
β-Ga2O3 is an attractive material for highvoltage applications and has the potential for monolithically integrated RF devices. A combination of Raman nanoparticle thermometry measurement and thermal simulation has been used to measure the peak channel temperature due to self-heating in β-Ga2O3 MOSFETs. The peak channel thermal resistance measured at the gate surface in the device center was 88 mm ...
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关键词
Temperature measurement,Logic gates,Thermal conductivity,Thermal resistance,Electrical resistance measurement,Conductivity,MOSFET
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