Erratum to “Comparison of Wide-Band-Gap Technologies for Soft-Switching Losses at High Frequencies” [Dec 20 12595-12600]
IEEE Transactions on Power Electronics(2021)
摘要
Presents corrections to the above named paper.
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关键词
Cascode, ${C}_{\text{OSS}}$ ,dynamic ${R}_{\text{DS(ON)}}$ degradation,GaN,gate loss,GIT,nonlinear resonance,output capacitance loss,Sawyer–Tower,SiC,Soft-switching,WBG technology
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