Resource-Based EM Modeling DRM for Multi-Core Microprocessors

Long-Term Reliability of Nanometer VLSI Systems(2019)

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Abstract
In this chapter, a new approach for system-level reliability management for multi-/manycore microprocessors is introduced. Early works mainly focus on dynamic thermal management (DTM ) techniques, which have been proposed in the past to keep the temperature to stay below a limit to avoid the temperature-sensitive long-term reliability problems. Those techniques, which typically consist of dynamic voltage and frequency scaling (DVFS ), task throttling, and clock gating, were first developed for single core microprocessors.
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