Real-Time, In-Situ Monitoring Of Gamma Radiation Effects In Packaged Silicon Photonic Chips

2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO)(2020)

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摘要
We measured in-situ gamma radiation effect and post-radiation relaxation behavior on packaged SiC integrated photonic devices. A method to deconvolve the radiation responses from constituent materials was also proposed and validated. (C) 2020 The Author(s)
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关键词
packaged silicon photonic chips,in-situ gamma radiation effect,post-radiation relaxation behavior,packaged SiC integrated photonic devices,radiation responses,in-situ monitoring,gamma radiation effects,SiC
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