The Structure And Resistance Characteristic Of Reduced Graphene Oxide Paper Under Atomic Oxygen Exposure

To study the effects of low earth orbit (LEO) environment on film surface structure and resistance characteristics, reduced graphene oxide paper (rGOP) was irradiated by atomic oxygen (AO) in ground-based simulation facility. A rough pits surface, chemical oxidation, and change in lamina thickness were found after AO exposure. The erosion yield under AO attack changed from 3.56 x 10(-25) to 4.04 x 10(-25) cm(3)/atom. The resistance data exhibited a linear relationship between R-0/R and AO fluence, and the maximum AO detect fluence reached to 5 x 10(19) atom/cm(3) when rGOP thickness was 0.8 mu m, which implies that greater thickness is expected to improve space service life of rGOP.