User dependent aging prediction model for automotive controllers with power electronics
2017 27th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS)(2017)
摘要
A framework to assess the reliability of an automotive motor controller with power electronics is presented in this paper. In specific, the significant power electronic device inside the controller, i.e., Insulated Gate Bipolar Transistor (IGBT), is modeled and its operation is simulated using the Matlab/Simulink tool. By computing its thermal behavior one can predict the impact of thermo-mechanical stress on the remaining lifetime of an IGBT under different mission scenarios.
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关键词
IGBT,Matlab/Simulink tool,user dependent aging prediction model,automotive controllers,automotive motor controller,Insulated Gate Bipolar Transistor,power electronic device,thermo-mechanical stress
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