Use Of Flicker Noise In Polyaniline To Determine The Product Of Mobility And Lifetime Of Charge Carriers

The current passing through a polyaniline layer generates electrical fluctuations, the amplitude of which increases in a part of the frequency spectrum with the inversion of the frequency f. It is deduced that this is due to the behavior of charge carriers trapped on energy levels in the bandgap. If these localized carriers are in equilibrium with the valence band, a frequency range can be found where the lifetime is inversely proportional to the frequency. Electron jumps between the levels and the valence band are manifested by the generation of electrical noise signals. The slope of the dependence of the noise current on 1/f was calculated, and the product of the mobility and lifetime of the holes was determined.