Identification of high-yielding wheat genotypes resistant to Pyrenophora tritici-repentis (tan spot)

EUPHYTICA(2021)

引用 7|浏览2
暂无评分
摘要
Tan spot, caused by Pyrenophora tritici-repentis , is a major foliar disease of wheat in Kazakhstan. This study evaluated 103 winter wheat genotypes for tan spot resistance and high-productivity traits in the field in two years. Entries were also characterized using the molecular marker Xfcp623 , indicative of Tsn1 gene conferring sensitivity to Ptr ToxA. The proportion of entries insensitive to Ptr ToxA was relatively high (71%). Forty-eight entries with the lowest tan spot severity in the field were confirmed to be insensitivity to Ptr ToxA in the molecular screening. Entries which were resistant under field conditions had similar level of seedling resistance. Principal component analysis biplots showed, that all spike productivity traits were highly correlated. Days to heading (DH) and tan spot severity, as well as the normalized difference vegetation index and DH were strongly correlated. Thousand kernels weight (TKW) and plant height were highly correlated and both were negatively correlated with DH and tan spot severity, indicating that taller cultivars tended to be more resistant. The Xfcp623 negative entries had lower disease severity (by about 40%), flowered up to 2 days later than entries with Tsn1 and had significantly more spikelets per spike, number of grains per spike, TKW and grain weight/spike. The results of the study will be important for increasing the efficiency of breeding based on the elimination of the genotypes with dominant allele Tsn1 . Of the 103 entries evaluated, 28 can be directly used in breeding programs to improve tan spot resistance and productivity of winter wheat.
更多
查看译文
关键词
Molecular markers, Principal component analysis biplots, Productivity traits, Tan spot, Wheat
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要