RT XFEL structure of the dark-stable state of Photosystem II (0F, S1-rich) at 2.08 Angstrom resolution
M. Ibrahim, T. Fransson,R. Chatterjee, M.H. Cheah,R. Hussein, L. Lassalle, K.D. Sutherlin,I.D. Young, F.D. Fuller,S. Gul,I.-S. Kim, P.S. Simon, C. de Lichtenberg, P. Chernev, I. Bogacz, C. Pham, A.M. Orville, N. Saichek, T.R. Northen, A. Batyuk, S. Carbajo, R. Alonso-Mori,K. Tono, S. Owada,A. Bhowmick, R. Bolotovski, D. Mendez, N.W. Moriarty, J.M. Holton, H. Dobbek, A.S. Brewster,P.D. Adams,N.K. Sauter,U. Bergmann, A. Zouni, J. Messinger,J. Kern, V.K. Yachandra,J. Yano user-6073b1344c775e0497f43bf9（2020）
关键词
Resolution (electron density),Photosystem II,Crystallography,Materials science,Angstrom,Stable state
AI 理解论文
溯源树
样例
