Mechanism Investigation of Temperature Dependent Growth and Etching Process of GeCl 4 on SiGe Surface: ab-initio Study
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)(2021)
摘要
Herein, we unveil the deposition and etch mechanism of GeCl4 on the SiGe surface. At the high temperature, GeCl4 is dissociated to GeCl2 and then worked as a deposition source. Thus, the rate determinant step of surface growth is GeCl4 dissociation, and a novel precursor that quickly dissociates to GeCl2 will be a proper precursor target to Ge growth at ...
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关键词
GSM,Thermodynamics,Temperature dependence,Temperature,Atomic layer deposition,Germanium,Etching
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