Mechanism Investigation of Temperature Dependent Growth and Etching Process of GeCl 4 on SiGe Surface: ab-initio Study

2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)(2021)

引用 0|浏览2
暂无评分
摘要
Herein, we unveil the deposition and etch mechanism of GeCl4 on the SiGe surface. At the high temperature, GeCl4 is dissociated to GeCl2 and then worked as a deposition source. Thus, the rate determinant step of surface growth is GeCl4 dissociation, and a novel precursor that quickly dissociates to GeCl2 will be a proper precursor target to Ge growth at ...
更多
查看译文
关键词
GSM,Thermodynamics,Temperature dependence,Temperature,Atomic layer deposition,Germanium,Etching
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要