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Reflectance Multispectral Imaging for Identification of Algae Contamination in High Voltage Insulators

OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP)(2021)

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Abstract
An algorithm to identify the algal contamination in high voltage insulators using Bhattacharyya distance, through Ultraviolet-Visible-Near Infrared multispectral images obtained utilizing an in-house developed multispectral imaging system.
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