Degradation of organic silane monolayers on silicon wafer during XPS measurementHiroyuki Yamato, Atsushi Nihei, Yuuki Kawamura,Fumio Kurayama,Takeshi Furusawa,Masahide Sato,Noboru SuzukiJournal of Surface Analysis(2014)引用 2|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要