Localized Excitation of Silicon Photonic Waveguides for Measurement of Free-Carrier Lifetime and Surface Recombination Velocity

Patrick S. Goley,Edward Preisler,John D. Cressler

conference on lasers and electro optics（2021）

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摘要

A pulsed 639 nm laser is focused to strongly excite 1-µm scale lengths of silicon photonic waveguide. Extraction of the local free-carrier lifetime and recombination velocity information from time-resolved transmission of a continuous 1535 nm probe laser is presented.

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关键词

silicon photonic waveguide,surface recombination,pulsed 639 nm laser,scale lengths,local free-carrier lifetime,recombination velocity information,continuous 1535 nm probe laser,wavelength 639.0 nm,wavelength 1535.0 nm

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