Triaxial Strain Evaluation for Carbon-doped Silicon Nanowire using X-ray Reciprocal Space Mapping (II) Kazutoshi Yoshioka,Gai Ogasawara,Kirito Cho, Yuta Ito,Sho Sugawa,Ichiro Hirosawa,Takeshi Watanabe,Ryo Yokogawa,Atsushi OguraThe Japan Society of Applied Physics(2021)引用 0|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要