Performance studies of the Belle II Silicon Vertex Detector with data taken at the DESY test beam in April 2016

T. Lück,K. Adamczyk,H. Aihara,Corrado Angelini,Tariq Aziz, V. Babu,S. Bacher,Seema Bahinipati, E. L. Barberio, Ti. Baroncelli, To. Baroncelli, A. K. Basith, G. Batignani, A. Bauer,Prafulla Kumar Behera,Thomas Bergauer,S. Bettarini,B. Bhuyan, T. Bilka,F. Bosi, L. Bosisio,A. Bozek, F. Buchsteiner,L. Bulla,G. Caria,G. Casarosa, M. Ceccanti, D. Červenkov, S. R. Chendvankar,N. Dash,G. De Pietro, S. T. Divekar, Z. Doležal,Dipanwita Dutta, F. Forti,Markus Friedl, K. Hara,Takuya Higuchi, T. Horiguchi,Christian Irmler,A. Ishikawa,H. B. Jeon,C. W. Joo,Jakub Kandra, N. Kambara,K. H. Kang,Takeo Kawasaki, P. Kodyč, T. Kohriki,S. Koike, M. M. Kolwalkar,Rakesh Kumar, W. Kun,Peter Kvasnicka,C. La Licata, L. Lanceri, J. Lettenbichler, J. Libby,Masatoshi Maki, P. Mammini,A. Martini La Licata, S. N. Mayekar,G. B. Mohanty,Saraju P. Mohanty,T. Morii, K. Nakamura, Z. Natkaniec, Y. Onuki, W. Ostrowicz,A. Paladino,E. Paoloni, H. Park,F. Pilo, A. Profeti,K. K. Rao,I. Rashevskaya, G. Rizzo,P. K. Resmi, M. Rozanska,Jun Sasaki,Noriaki K. Sato, S. Schultschik, C. Schwanda,Benjamin Schwenker, Y. Seino,Noritaka Shimizu, U. Stolzenberg,J. Stypula, J. Suzuki,Satoshi Tanaka, G. N. Taylor,R. Thalmeier, R. Thomas, T. Tsuboyama, S. Uozumi,Phillip Urquijo, L. Vitale, M. Watanabe

Proceedings of The 25th International workshop on vertex detectors — PoS(Vertex 2016)(2017)

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摘要
Belle II is a multipurpose detector currently under construction which will be operated at the next generation B-factory SuberKEKB in Japan. Its main devices for the vertex reconstruction are the Silicon Vertex Detector (SVD) and the Pixel Detector (PXD). In April 2016 a sector of the Belle II SVD and PXD have been tested in a beam of high energetic electrons at the test beam facility at DESY Hamburg (Germany). We report here the results for the hit efficiency estimation and the measurement of the resolution for the Belle II silicon vertex etector. We find that the hit efficiencies are on average above 99.5% and that the measured resolution is within the expectations.
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desy test beam,silicon
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