Clarification of Endurance Failure Mechanisms for HfO 2 -based Ferroelectric Tunnel Junction MemoryMarina Yamaguchi,Shosuke Fujii,Shoichi Kabuyanagi,Yuuichi Kamimuta,Tsunehiro Ino,Yasushi Nakasaki,Riichiro Takaishi,Reika Ichihara,Masumi SaitohThe Japan Society of Applied Physics(2018)引用 0|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要