Sparse and Robust RRAM-based Efficient In-memory Computing for DNN Inference

2022 IEEE International Reliability Physics Symposium (IRPS)(2022)

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摘要
Resistive random-access memory (RRAM)-based in-memory computing (IMC) recently became a promising paradigm for efficient deep neural network acceleration. The multi-bit RRAM arrays provide dense storage and high throughput, whereas the physical non-ideality of the RRAM devices impairs the retention characteristics of the resistive cells, leading to accuracy degradation. On the algorithm side, vari...
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关键词
Temperature measurement,Deep learning,Semiconductor device measurement,Computational modeling,Neural networks,Prototypes,Throughput
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