Radiation immunity study on space environment application of new integrated circuits

It is known that most of the spacecraft orbital defects are SEE (Single-Event Effects) phenomena in which cosmic radiation collides with an integrated circuit. In this research, we verify the survivability of integrated circuits due to the SEE phenomenon. The incidence of SEE phenomenon was acquired by irradiating the integrated circuit with a proton beam under five conditions. Two irradiation tests were carried out on three integrated circuits including PIC16F877, which is also installed on the low earth orbit environment observation satellite "Ten-kou". The results of this test show that PIC16F877 has a certain level of resistance, but the limits of its capabilities have become apparent. In the future, it was determined that the radiation resistance of other integrated circuits should be investigated and more appropriate devices should be found.