谷歌浏览器插件
订阅小程序
在清言上使用

NVIDIA MATHS: Mechanism to Access Test-Data over High-Speed Links

IEEE DESIGN & TEST(2023)

引用 1|浏览10
暂无评分
摘要
The Mechanism to Access Test-Data over High-Speed Link (MATHS) provides a high-throughput PCIe-based system to structurally test system-on-chips (SoCs) at wafer and system levels. With this system, the SoC can be directly tested at the system level and the reliance on expensive test equipment. Since MATHS simplifies the necessary ATE architecture and design, smaller and lower cost testers can be employed to test the SoC. The system is based on PCIe standards, making it highly portable across all platforms, including ATE, system-level test, board, and in-field testing.
更多
查看译文
关键词
test-access mechanism,PCIE,high-speed interface,ATE,SLT,in-system test
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要