ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction

Journal Article ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction Get access Jacob Madsen, Jacob Madsen University of Vienna, Faculty of Physics, Vienna, Austria Search for other works by this author on: Oxford Academic Google Scholar Christoph Hofer, Christoph Hofer Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium Search for other works by this author on: Oxford Academic Google Scholar Thomas C Pekin, Thomas C Pekin Humboldt-Universität zu Berlin, Institut für Physik & IRIS, Adlershof, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Marcel Schloz, Marcel Schloz Humboldt-Universität zu Berlin, Institut für Physik & IRIS, Adlershof, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Thuy An Bui, Thuy An Bui University of Vienna, Faculty of Physics, Vienna, Austria Search for other works by this author on: Oxford Academic Google Scholar Christoph Koch, Christoph Koch Humboldt-Universität zu Berlin, Institut für Physik & IRIS, Adlershof, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Timothy J Pennycook, Timothy J Pennycook Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium Search for other works by this author on: Oxford Academic Google Scholar Toma Susi Toma Susi University of Vienna, Faculty of Physics, Vienna, Austria Corresponding author: toma.susi@univie.ac.at Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 392–393, https://doi.org/10.1017/S143192762200229X Published: 01 August 2022