In-situ Fracture Toughness of Single Crystal Silicon Double-Cantilever BeamsSara M. Dickens,Frank W. DelRio,Scott J. Grutzik,William M. Mook,Brad L. Boyce,Eric Hintsala,Douglas Stauffer,Robert F. CookMicroscopy and Microanalysis(2022)引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要