Wafer-Scale Bi-Assisted Semi-Auto Dry Transfer and Fabrication of High-Performance Monolayer CVD WS2 Transistor.

2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)(2022)

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摘要
A novel wafer-scale semi-automated dry transfer process for monolayer (1L) CVD WS 2 was developed utilizing the weakly coupled interface between semimetal (Bi) and two-dimensional (2D) semiconductor (WS 2 ). Bi semimetal serves as a gently adhesive transfer template for 2D materials, introducing minimal additional defects during the transfer process. Based on 2D materials processed using this new transfer method, semimetal-contacted (Bi and Sb) monolayer CVD WS 2 nFETs were further demonstrated at wafer scale. Our CVD 1L WS 2 nFETs fabricated using semimetal-assisted transfer with semimetal (Bi and Sb) contacts show record high on-current of 250 µA/µm and 243 µA/µm at V DS = 1 V, and record low contact resistance of 0.63 kΩ•µm and 0.73 kΩ•µm, respectively.
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关键词
contact resistance,field effect transistor,monolayer,chemical vapour deposition,semimetal,two-dimensional semiconductor,semiauto dry transfer,adhesive transfer,Bi-WS2,Sb-WS2
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