Bandpass Negative Group Delay Analysis of VIu-Shaped Trace Crosstalk Effect: Invited paper

2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)(2022)

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摘要
This paper investigates on the bandpass (BP) negative group delay (NGD) effect from printed circuit board (PCB) trace crosstalk. The designed and prototyped PCB proof-of-concept (POC) is constituted by arbitrary traces of Vlushaped coupled lines ended by radial open stubs. The BP-NGD function is characterized by the basic qualification parameters as the NGD value, center frequency and bandwidth. The influence of the u- and V-shape trace physical parameters on the main interconnect I-line is illustrated by sensitivity analyses. The Vlu POC BP-NGD behavior is validated by simulation and measurement. The BP NGD analysis reveals the PCB trace crosstalk effect with the apparition of dual-band response characterized by NGD value-center frequencies of about (−1 ns, 2.43 GHz) and (−1 ns, 2.58 GHz).
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关键词
Negative group delay (NGD),Bandpass (BP) NGD function,PCB trace crosstalk,BP-NGD experimentation
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