Research on thermal vacuum reliability of pulse high-power solid-state power amplifier (SSPA) for satellite use

This paper investigates the abnormal phenomenon of local blackening of the internal circuit substrate caused by low-pressure discharge in the thermal vacuum test of an L-band high-power pulsed solid-state power amplifier for satellite use, i.e., the residual flux inside the product volatilizes under vacuum conditions. Thus, the low-pressure discharge causes a rise in local temperature, and under high local temperature, the silicone rubber is thermally decomposed. There are four proposed engineering improvements, which are proved to be feasible and effective through simulation and re-test verification. The blackening problem's observation, analysis, and resolution are crucial to improve the reliability of high-power microwave solid-state power amplifiers used in spacecraft in high orbit.