The nanoscale imaging of the bulk polycrystalline material with the effects of depth of field and field of view based on x-ray free electron laser

Microscale imaging of mesoscale bulk materials under dynamic compression is important for understanding their properties. In this work, we study the effects of the depth of field (DoF) and field of view (FoV) of the optical lens and extract the scattered light of the region to be imaged within the bulk polycrystalline material based on the objective Bragg coherent diffraction imaging. We describe how the DoF and FoV quantitatively limit the diffraction volume, where the DoF and FoV limit the scattering region parallel and perpendicular to the direction of the light source respectively. We demonstrate this scheme by simulating the separate imaging of a submicron-sized crack region within a few {\mu}m-sized Si bulk material, and obtain a high imaging quality. This scheme enables imaging of selected regions within bulk polycrystalline materials with the resolution up to the order of 10 nm.