Dynamic Data Fault Localization for Deep Neural Networks

Yining Yin,Yang Feng, Shihao Weng,Zixi Liu,Yuan Yao,Yichi Zhang,Zhihong Zhao,Zhenyu Chen

PROCEEDINGS OF THE 31ST ACM JOINT MEETING EUROPEAN SOFTWARE ENGINEERING CONFERENCE AND SYMPOSIUM ON THE FOUNDATIONS OF SOFTWARE ENGINEERING, ESEC/FSE 2023（2023）

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Key words

fault localization,deep learning testing,data quality

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