XPS Al and high energy x-ray photoelectron spectroscopy (HAXPES) Cr measurement of bulk boron

C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen,Kateryna Artyushkova,Thierry Conard

Surface Science Spectra(2023)

引用 0|浏览2
暂无评分
摘要
Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.
更多
查看译文
关键词
photoelectron,x-ray
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要