Investigation of vacuum measurement by nano-gap device

Kazuki Komiya, Koki Nagata,Hidehiko Yamaoka,Shuichi Date, Yuito Miyashita, Min Yan

ELECTRONICS AND COMMUNICATIONS IN JAPAN(2024)

引用 0|浏览0
暂无评分
摘要
Advances in microfabrication technology have enabled electron beam lithography (EB lithography) systems to produce microfabrication on the order of 10 of nanometers. Using this technology, we have fabricated nanogap electrodes that can generate large electric fields at low voltages. The gap between the tips of the fabricated electrodes is 100 nm, and the curvature of each tip is 50 nm. The device was confirmed to work as an electronic vacuum gauge, the device successfully measured vacuum from 10-3 to 1 Pa at the electrode voltage of 3 V.
更多
查看译文
关键词
cold cathode field emission,electron beam lithography,nanogap,vacuum
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要