Design of a Radiation-Tolerant Bandgap Voltage Reference for HEP applications

Gianluca Traversi,Luigi Gaioni,Rafael Ballabriga,Davide Ceresa,Stefano Michelis

2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)（2022）

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摘要

This work discusses the design of a bandgap voltage reference circuit to be operated in harsh radiation environments. The circuit, designed in a standard 28 nm CMOS technology with a core voltage supply of 0.9 V, exhibits in simulations an average output voltage of about 480 mV with an average temperature coefficient of 22 ppm/°C in the range [-40°C, 60°C]. Some preliminary results of the characterization are also presented.

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关键词

Radiation Tolerance,Circuit Design,Supply Voltage,CMOS Technology,Resistance Values,Voltage Drop

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