Temperature Dependence of Terrestrial Neutron Induced Failures in Commercial Silicon and Silicon Carbide Power MOSFETs

Fabio Principato,Carlo Cazzaniga,Maria Kastriotou,Christopher Frost,Antonino Buttacavoli,Leonardo Abbene,Francesco Pintacuda

2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)（2022）

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摘要

Accelerated neutron tests on Si and SiC power MOSFETs at different temperatures were performed at ChipIr facility (Didcot, UK). The results show a strong correlation between the temperature dependence of the avalanche voltage and that of the neutron failure rate.

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failure in time,temperature,chip irradiation,power devices,Single-Event Burnout,Space Weather

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