Radiation behaviour of mm-wave on-wafer probes in H-band and the influence on antenna measurements

This letter presents a comprehensive analysis of the radiation behaviour exhibited by nine distinct on-wafer radio-freqeuncy (RF) probes used for device characterization in the mm-wave bands of integrated circuits and antennas. The tested probes are sourced from two different manufacturers and feature various probe pitches. All probes are intended for use with the WR-3.4 waveguide band ranging from 220 to 330 GHz. To the best of the authors' knowledge, such a detailed examination of RF probes operating in this band with respect to their radiation behaviour has not been demonstrated before. This letter investigates the radiation behaviour of mm-wave on-wafer probes and their influence on antenna measurements. Using a free-space antenna measurement station, the radiation of commonly used mm-wave probes in the H-band is measured, and the influence on antenna measurements evaluated. image